Related by context. Frequent words. (Click for all words.) 57 IEEE #.# [002] 56 Labview 56 NI TestStand 56 boundary scan 56 WS Addressing 56 EDDL 56 Business Process Modeling 55 SystemC models 55 roadmapping 55 ScanWorks 55 computational lithography 55 ENOVIA MatrixOne 54 Artisan Studio 54 IP XACT 54 Spirent TestCenter 54 Cadence Virtuoso 54 NX Nastran 54 ARM RealView 54 SiSoft 54 SPECviewperf 54 UML modeling 54 OptimalJ 54 Quartus II 53 Altera FPGAs 53 PXI Express 53 JTAG Boundary Scan 53 IC CAP 53 LabView 53 xTCA 53 ARM7TDMI 52 AVR# [002] 52 JReport 52 MicroBlaze 52 AdvancedTCA ATCA 52 SysML 52 FactoryTalk 52 AXIe 52 C#x [001] 52 SilkTest 52 Synplify Pro 52 expressor 52 Common Criteria evaluation 52 Coverity Prevent 52 JAUS 52 Cadence Encounter 52 Java APIs 52 iWARP 52 DMAIC 52 PlanAhead 52 IBM Tivoli Netcool 52 Open Verification Methodology 52 VSIA 51 Unified Modeling Language 51 JTAG Technologies 51 BMC Atrium CMDB 51 OrCAD 51 QuickSec 51 NVIDIA Tesla 51 GoAhead 51 Corelis 51 iTest 51 ABAQUS 51 MosChip 51 QualiSystems 51 PureDisk 51 StarCore 51 RF4CE 51 PDKs 51 Freescale i.MX# [002] 51 NGOSS 51 OpenSplice DDS 51 bit RISC processor 51 Validation Program 51 Toolset 51 AltiVec 51 IEEE P#.# 51 ZigBee compliant 51 RTLinux 51 RTView 51 Altium Designer 51 Xacta IA Manager 51 PSoC Creator 50 synthesizable 50 Nios II 50 STIL 50 Arithmatica 50 SpyGlass 50 Modulo Risk Manager 50 MIPS cores 50 DCML 50 PowerTheater 50 Worksoft Certify 50 symmetric multiprocessing SMP 50 Solution Accelerators 50 TestShell 50 VMLogix LabManager 50 configurable processor 50 HyperTransport Consortium 50 VMmark 50 DesignWare IP 50 Synopsys Galaxy